Backside Absorbing Layer Microscopy: A universal relationship between physical thickness and reflectivity
Résumé
The Backside Absorbing Layer Microscopy (BALM) is a recently introduced surface imaging technique in reflected light with an unprecedented combination of sensitivity and lateral resolution, hence very promising for the development of imaging sensors. This requires to turn BALM images into quantitative measurements. The usual way to analyze reflectivity measurements is to compare the optical signal and a numerical model with many adjustable parameters. Here we demonstrate a universal relationship between the sample reflectivity and the physical thickness of the sample, ruled by three measurable quantities. Mapping the true sample thickness becomes possible whatever the instrument configuration and the sample refractive index. Application to kinetic measurements is discussed.
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Abou Khachfe- Ausserré Optics Express 190621 late version.pdf (668.19 Ko)
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