XPS, ToF SIMS and wettability analyses on Ni surfaces after Ar-H2 RF plasma treatment: An efficient and optimized plasma treatment approach - Archive ouverte HAL Access content directly
Journal Articles Surface and Coatings Technology Year : 2020

XPS, ToF SIMS and wettability analyses on Ni surfaces after Ar-H2 RF plasma treatment: An efficient and optimized plasma treatment approach

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L. Vivet
M.F. Falzon
  • Function : Author
K.-L. Tan
  • Function : Author
D. Dorairaj
  • Function : Author
J.-M. Morelle
  • Function : Author
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hal-03880604 , version 1 (01-12-2022)

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L. Vivet, R. Benoit, M.F. Falzon, K.-L. Tan, D. Dorairaj, et al.. XPS, ToF SIMS and wettability analyses on Ni surfaces after Ar-H2 RF plasma treatment: An efficient and optimized plasma treatment approach. Surface and Coatings Technology, 2020, 398, pp.126094. ⟨10.1016/j.surfcoat.2020.126094⟩. ⟨hal-03880604⟩
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