XPS, ToF SIMS and wettability analyses on Ni surfaces after Ar-H2 RF plasma treatment: An efficient and optimized plasma treatment approach

L. Vivet , R. Benoit (1) , M.F. Falzon (2) , K.-L. Tan , D. Dorairaj , J.-M. Morelle

1 ICARE - Institut de Combustion, Aérothermique, Réactivité et Environnement
2 HUTCHINSON

Domaines: Chimie

L. Vivet, R. Benoit, M.F. Falzon, K.-L. Tan, D. Dorairaj, et al.. XPS, ToF SIMS and wettability analyses on Ni surfaces after Ar-H2 RF plasma treatment: An efficient and optimized plasma treatment approach. Surface and Coatings Technology, 2020, 398, pp.126094. ⟨10.1016/j.surfcoat.2020.126094⟩. ⟨hal-03880604⟩