Is XPS combined with argon ion sputtering pertinent for depth profiling molybdenum-implanted stainless-steel layers? - Archive ouverte HAL Access content directly
Journal Articles Surface and Interface Analysis Year : 2002

Is XPS combined with argon ion sputtering pertinent for depth profiling molybdenum-implanted stainless-steel layers?

, , (1) ,
1
N. Mottu
  • Function : Author
M. Vayer
  • Function : Author
R. Benoit
Centre de Recherche sur la Matière Divisée
R. Erre
  • Function : Author

Domains

Chemical Sciences

Roland BENOIT  : Connect in order to contact the contributor

https://hal-cnrs.archives-ouvertes.fr/hal-03878186

Submitted on : Tuesday, November 29, 2022-4:41:37 PM

Last modification on : Wednesday, November 30, 2022-4:05:14 AM

Not file

Dates and versions

hal-03878186 , version 1 (29-11-2022)

Identifiers

Cite

N. Mottu, M. Vayer, R. Benoit, R. Erre. Is XPS combined with argon ion sputtering pertinent for depth profiling molybdenum-implanted stainless-steel layers?. Surface and Interface Analysis, 2002, 34 (1), pp.276-279. ⟨10.1002/sia.1299⟩. ⟨hal-03878186⟩

Export

BibTeX TEI Dublin Core DC Terms EndNote Datacite

Collections

CNRS UNIV-ORLEANS ICMN
0 View
0 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More