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Journal Articles Surface and Interface Analysis Year : 2002

Is XPS combined with argon ion sputtering pertinent for depth profiling molybdenum-implanted stainless-steel layers?

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N. Mottu
  • Function : Author
M. Vayer
  • Function : Author
R. Benoit
R. Erre
  • Function : Author
Not file

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hal-03878186 , version 1 (29-11-2022)

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N. Mottu, M. Vayer, R. Benoit, R. Erre. Is XPS combined with argon ion sputtering pertinent for depth profiling molybdenum-implanted stainless-steel layers?. Surface and Interface Analysis, 2002, 34 (1), pp.276-279. ⟨10.1002/sia.1299⟩. ⟨hal-03878186⟩
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