Skip to Main content Skip to Navigation
Journal articles

Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction

Abstract : Electrical aging in lead zirconate titanate (PbZrxTi1−xO3) thin films has been intensively studied from a macroscopic perspective. However, structural origins and consequences of such degradation are less documented. In this study, we have used synchrotron radiation to evaluate the behavior of ferroelectric domains by X-ray diffraction (XRD). The sample was loaded with an AC triangular bias waveform between ±10 V with a number of cycle varying from one up to 108. At each step of the aging procedure, XRD spectra had been collected in situ during the application of an electric field on a capacitor. The fine analysis of the (200) pseudo-cubic peak structure allows to separate the evolution of the volume of a/c tetragonal and rhombohedral domains along the electrical biasing. Throughout the aging, both intrinsic and extrinsic responses of tetra and rhombohedral domains are altered, the behavior depending on the observed phase. This methodology opens up new perspectives in the comprehension of the aging effect in ferroelectric thin film.
Document type :
Journal articles
Complete list of metadata

https://hal-cnrs.archives-ouvertes.fr/hal-03722787
Contributor : Colette ORANGE Connect in order to contact the contributor
Submitted on : Wednesday, July 13, 2022 - 3:47:39 PM
Last modification on : Thursday, July 21, 2022 - 2:10:29 PM

File

Materials_14_4500.pdf
Publisher files allowed on an open archive

Identifiers

Collections

CEA | CNRS | DRT | LETI | CEA-GRE

Citation

Kien Nguyen, Ewen Bellec, Edoardo Zatterin, Gwenael Le Rhun, Patrice Gergaud, et al.. Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction. Materials, MDPI, 2021, 14 (16), pp.4500. ⟨10.3390/ma14164500⟩. ⟨hal-03722787⟩

Share

Metrics

Record views

0

Files downloads

0