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The individual thickness characterization of stacked sample by terahertz imaging

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https://hal-cnrs.archives-ouvertes.fr/hal-03477595
Contributor : Nadege Dastillung Connect in order to contact the contributor
Submitted on : Monday, December 13, 2021 - 2:51:49 PM
Last modification on : Tuesday, January 4, 2022 - 6:51:11 AM

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  • HAL Id : hal-03477595, version 1

Citation

Min Zhai, A. Locquet, David Citrin. The individual thickness characterization of stacked sample by terahertz imaging. 11th THz young scientist meeting, Mar 2020, Marburg, Germany. ⟨hal-03477595⟩

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