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The individual thickness characterization of stacked sample by terahertz imaging

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hal-03477595 , version 1 (13-12-2021)

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  • HAL Id : hal-03477595 , version 1

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Min Zhai, A. Locquet, David S. Citrin. The individual thickness characterization of stacked sample by terahertz imaging. 11th THz young scientist meeting, Mar 2020, Marburg, Germany. ⟨hal-03477595⟩
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