The individual thickness characterization of stacked sample by terahertz imaging

Min Zhai; A. Locquet; David S. Citrin

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The individual thickness characterization of stacked sample by terahertz imaging

(1) , (1) , (1)

1

Min Zhai

Function : Author

Georgia Tech Lorraine [Metz]

A. Locquet

Function : Author
PersonId : 738719
IdHAL : alexandre-locquet
ORCID : 0000-0002-6674-4956
IdRef : 090195280

Georgia Tech Lorraine [Metz]

David S. Citrin

Function : Author

Georgia Tech Lorraine [Metz]

Domains

Engineering Sciences [physics] Optics / Photonic

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https://hal-cnrs.archives-ouvertes.fr/hal-03477595

Submitted on : Monday, December 13, 2021-2:51:49 PM

Last modification on : Sunday, June 26, 2022-3:24:53 AM

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hal-03477595 , version 1 (13-12-2021)

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HAL Id : hal-03477595 , version 1

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Min Zhai, A. Locquet, David S. Citrin. The individual thickness characterization of stacked sample by terahertz imaging. 11th THz young scientist meeting, Mar 2020, Marburg, Germany. ⟨hal-03477595⟩

The individual thickness characterization of stacked sample by terahertz imaging

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