Multi-microscopy nanoscale characterization of the doping profile in a hybrid Mg/Ge-doped tunnel junction - Archive ouverte HAL Access content directly
Journal Articles Nanotechnology Year : 2020

Multi-microscopy nanoscale characterization of the doping profile in a hybrid Mg/Ge-doped tunnel junction

Multi-microscopy nanoscale characterization of the doping profile in a hybrid Mg/Ge-doped tunnel junction

(1) , , , , , , , , , , , , (2) , ,
1
2
A Mavel
  • Function : Author
V Fan Arcara
  • Function : Author
B Damilano
Ioanna Dimkou
S Vézian
  • Function : Author
A Grenier
  • Function : Author
M Veillerot
  • Function : Author
N Rochat
  • Function : Author
G Feuillet
  • Function : Author
B Bonef
  • Function : Author
L Rigutti
  • Function : Author
E Monroy
D Cooper
  • Function : Author

Dates and versions

hal-03411327 , version 1 (02-11-2021)

Identifiers

Cite

E Di Russo, A Mavel, V Fan Arcara, B Damilano, Ioanna Dimkou, et al.. Multi-microscopy nanoscale characterization of the doping profile in a hybrid Mg/Ge-doped tunnel junction. Nanotechnology, 2020, 31 (46), pp.465706. ⟨10.1088/1361-6528/ab996c⟩. ⟨hal-03411327⟩
13 View
0 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More