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Journal articles

Backside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity

Refahi Abou Khachfe 1 Dominique Ausserre 2, 3
1 Université Libanaise
2 CNRS - Centre National de la Recherche Scientifique
3 IMMM - Institut des Molécules et Matériaux du Mans
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Journal articles
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https://hal-cnrs.archives-ouvertes.fr/hal-03053790
Contributor : Dominique Ausserré Connect in order to contact the contributor
Submitted on : Friday, December 11, 2020 - 11:06:08 AM
Last modification on : Tuesday, January 4, 2022 - 6:06:50 AM

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CNRS | UNIV-LEMANS | INC-CNRS | IMMM-LEMANS

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Refahi Abou Khachfe, Dominique Ausserre. Backside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity. Optics Express, Optical Society of America - OSA Publishing, 2020, 28 (4), pp.4836. ⟨10.1364/OE.28.004836⟩. ⟨hal-03053790⟩

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