Backside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity

Refahi Abou Khachfe; Dominique Ausserre

doi:10.1364/OE.28.004836

Journal articles

Backside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity

Refahi Abou Khachfe ¹ Dominique Ausserre ^{2, 3}

1 Université Libanaise

2 CNRS - Centre National de la Recherche Scientifique

3 IMMM - Institut des Molécules et Matériaux du Mans

Document type :

Journal articles

Domain :

Engineering Sciences [physics] / Optics / Photonic

Engineering Sciences [physics] / Signal and Image processing

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https://hal-cnrs.archives-ouvertes.fr/hal-03053790
Contributor : Dominique Ausserré Connect in order to contact the contributor
Submitted on : Friday, December 11, 2020 - 11:06:08 AM
Last modification on : Saturday, December 12, 2020 - 3:34:12 AM

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Backside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity

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