Refahi Abou Khachfe, Dominique Ausserre. Backside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity.
Optics Express, Optical Society of America - OSA Publishing, 2020, 28 (4), pp.4836.
⟨10.1364/OE.28.004836⟩.
⟨hal-03053790⟩