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Journal Articles Optics Express Year : 2020

Backside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity

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hal-03053790 , version 1 (11-12-2020)

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Refahi Abou Khachfe, Dominique Ausserre. Backside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity. Optics Express, 2020, 28 (4), pp.4836. ⟨10.1364/OE.28.004836⟩. ⟨hal-03053790⟩
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