Backside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity

Refahi Abou Khachfe; Dominique Ausserre

doi:10.1364/OE.28.004836

Journal Articles Optics Express Year : 2020

Backside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity

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Refahi Abou Khachfe

Function : Author

Université Libanaise

Dominique Ausserre

Function : Author
PersonId : 741521
IdHAL : dominique-ausserre
ORCID : 0000-0001-7736-0539
IdRef : 130370614

Centre National de la Recherche Scientifique

Institut des Molécules et Matériaux du Mans

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Engineering Sciences [physics] Optics / Photonic Engineering Sciences [physics] Signal and Image processing

dominique ausserré : Connect in order to contact the contributor

https://hal-cnrs.archives-ouvertes.fr/hal-03053790

Submitted on : Friday, December 11, 2020-11:06:08 AM

Last modification on : Sunday, June 26, 2022-3:00:42 AM

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hal-03053790 , version 1 (11-12-2020)

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HAL Id : hal-03053790 , version 1
DOI : 10.1364/OE.28.004836

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Refahi Abou Khachfe, Dominique Ausserre. Backside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity. Optics Express, 2020, 28 (4), pp.4836. ⟨10.1364/OE.28.004836⟩. ⟨hal-03053790⟩

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Backside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity

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