Skip to Main content Skip to Navigation
Journal articles

Backside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity

Complete list of metadata

https://hal-cnrs.archives-ouvertes.fr/hal-03053790
Contributor : dominique ausserré Connect in order to contact the contributor
Submitted on : Friday, December 11, 2020 - 11:06:08 AM
Last modification on : Sunday, June 26, 2022 - 3:00:42 AM

Links full text

Identifiers

Collections

Citation

Refahi Abou Khachfe, Dominique Ausserre. Backside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity. Optics Express, Optical Society of America - OSA Publishing, 2020, 28 (4), pp.4836. ⟨10.1364/OE.28.004836⟩. ⟨hal-03053790⟩

Share

Metrics

Record views

11