Journal Articles
Optics Express
Year : 2020
dominique ausserré : Connect in order to contact the contributor
https://hal-cnrs.archives-ouvertes.fr/hal-03053790
Submitted on : Friday, December 11, 2020-11:06:08 AM
Last modification on : Sunday, June 26, 2022-3:00:42 AM
Cite
Refahi Abou Khachfe, Dominique Ausserre. Backside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity. Optics Express, 2020, 28 (4), pp.4836. ⟨10.1364/OE.28.004836⟩. ⟨hal-03053790⟩
Collections
12
View
0
Download