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Bright, polarization-tunable high repetition rate extreme ultraviolet beamline for coincidence electron–ion imaging

A Comby 1 E Bloch 1 S Beauvarlet 1 D Rajak 1 S Beaulieu 1 D Descamps 1 A Gonzalez F Guichard S Petit 1 Y Zaouter V Blanchet 1 Y Mairesse 1 
1 CELIA - Centre d'Etudes Lasers Intenses et Applications
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https://hal-cnrs.archives-ouvertes.fr/hal-03005114
Contributor : Valerie Blanchet Connect in order to contact the contributor
Submitted on : Friday, November 13, 2020 - 9:56:59 PM
Last modification on : Tuesday, March 29, 2022 - 3:28:46 AM

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A Comby, E Bloch, S Beauvarlet, D Rajak, S Beaulieu, et al.. Bright, polarization-tunable high repetition rate extreme ultraviolet beamline for coincidence electron–ion imaging. Journal of Physics B: Atomic, Molecular and Optical Physics, IOP Publishing, 2020, 53 (23), pp.234003. ⟨10.1088/1361-6455/abbe27⟩. ⟨hal-03005114⟩

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