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Journal Articles Journal of Cryptographic Engineering Year : 2020

Detecting Faults in Inner Product Masking Scheme IPM-FD: IPM with Fault Detection

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Abstract

Side-channel analysis and fault injection attacks are two typical threats to cryptographic implementations , especially in modern embedded devices. Thus there is an insistent demand for dual side-channel and fault injection protections. As we know, masking is a kind of provable countermeasure against side-channel attacks. Recently, inner product masking (IPM) was proposed as a promising higher-order masking scheme against side-channel analysis, but not for fault injection attacks. In this paper, we devise a new masking scheme named IPM-FD. It is built on IPM, which enables fault detection. This novel masking scheme has three properties: the security orders in the word-level probing model, bit-level probing model, and the number of detected faults. IPM-FD is proven secure both in the word-level and in the bit-level probing models, and allows for end-to-end fault detection against fault injection attacks. * This work is an extension of [8] (PROOFS 2019). Furthermore, we illustrate its security order by interpreting IPM-FD as a coding problem then linking it to one defining parameters of linear code, and show its implementation cost by applying IPM-FD to AES-128.
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Dates and versions

hal-02915673 , version 1 (15-08-2020)

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Wei Cheng, Claude Carlet, Kouassi Goli, Jean-Luc Danger, Sylvain Guilley. Detecting Faults in Inner Product Masking Scheme IPM-FD: IPM with Fault Detection. Journal of Cryptographic Engineering, 2020, ⟨10.1007/s13389-020-00227-6⟩. ⟨hal-02915673⟩
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