Skip to Main content Skip to Navigation
Journal articles

Current distribution in metallic multilayers from resistance measurements

Abstract : The in-plane current profile within multilayers of generic structure Ta/Pt/(CoNi)/Pt/Ta is investigated. A large set of samples where the thickness of each layer is systematically varied was grown, followed by the measurement of the sheet resistance of each sample. The data are analyzed by a series of increasingly elaborate models, from a macroscopic engineering approach to mesosco-pic transport theory. Non-negligible variations of the estimated repartition of current between the layers are found. The importance of having additional structural data is highlighted.
Document type :
Journal articles
Complete list of metadata

Cited literature [39 references]  Display  Hide  Download
Contributor : Andre Thiaville Connect in order to contact the contributor
Submitted on : Friday, July 3, 2020 - 6:29:20 PM
Last modification on : Tuesday, September 13, 2022 - 4:18:23 PM
Long-term archiving on: : Thursday, September 24, 2020 - 9:08:44 AM


Files produced by the author(s)



Ondrej Stejskal, André Thiaville, Jaroslav Hamrle, Shunsuke Fukami, Hideo Ohno. Current distribution in metallic multilayers from resistance measurements. Physical Review B, American Physical Society, 2020, 101 (23), ⟨10.1103/PhysRevB.101.235437⟩. ⟨hal-02889443⟩



Record views


Files downloads