Proceedings
Year : 2018
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https://hal-cnrs.archives-ouvertes.fr/hal-02365398
Submitted on : Friday, November 15, 2019-1:35:30 PM
Last modification on : Wednesday, October 26, 2022-8:10:07 AM
Cite
L. Schwab, P.E. Allain, L. Banniard, A. Fafin, M. Gély, et al.. Comprehensive optical losses investigation of VLSI Silicon optomechanical ring resonator sensors. 2018 IEEE International Electron Devices Meeting (IEDM), Dec 2018, San Francisco, France. IEEE, pp.4.7.1-4.7.4, 2018, ⟨10.1109/IEDM.2018.8614508⟩. ⟨hal-02365398⟩
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