Investigation of critical parameters in power supplies components failure due to electric pulse

L. Curos; T. Dubois; G. Mejecaze; F. Puybaret; B. Plano; J.-M. Vinassa

doi:10.1016/j.microrel.2020.113936

Journal Articles Microelectronics Reliability Year : 2020

Investigation of critical parameters in power supplies components failure due to electric pulse

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1

L. Curos

Function : Correspondent author

Laboratoire de l'intégration, du matériau au système

T. Dubois

Function : Author

Laboratoire de l'intégration, du matériau au système

G. Mejecaze

Function : Author

F. Puybaret

Function : Author

B. Plano

Function : Author

Laboratoire de l'intégration, du matériau au système

J.-M. Vinassa

Function : Author

Laboratoire de l'intégration, du matériau au système

Domains

Engineering Sciences [physics]

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Submitted on : Monday, November 21, 2022-11:20:16 AM

Last modification on : Monday, November 21, 2022-11:20:17 AM

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hal-03493510 , version 1 (21-11-2022)

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Attribution - NonCommercial - CC BY 4.0

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HAL Id : hal-03493510 , version 1
DOI : 10.1016/j.microrel.2020.113936
PII : S0026-2714(20)30767-8

Cite

L. Curos, T. Dubois, G. Mejecaze, F. Puybaret, B. Plano, et al.. Investigation of critical parameters in power supplies components failure due to electric pulse. Microelectronics Reliability, 2020, 114, pp.113936 -. ⟨10.1016/j.microrel.2020.113936⟩. ⟨hal-03493510⟩

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Investigation of critical parameters in power supplies components failure due to electric pulse

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