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Article Dans Une Revue IEEE Transactions on Industry Applications Année : 2023

Switch Fault detection and localization for T-Type Converter

Florent Becker
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Philippe Poure

Résumé

Over the past decade, multilevel converters have received considerable interest in medium voltage applications. A large number of active switches in a multilevel converter increases the probability of switch failure and decreases the reliability of the system. An open switch fault can lead to a malfunction of the whole system and should be diagnosed as soon as possible. In this paper, an open-switch fault diagnosis method for a five-level H-Bridge T-type converter is presented. The proposed fault detection method and the fault localization algorithm are based on the switching patterns and the converter output voltage level observation. This approach is capable to detect and localize an open circuit fault for all switches. First, it is validated by simulations in Matlab Simulink and Simscape toolbox environments. Experimental results are also presented and discussed to validate the simulation results.
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hal-03971138 , version 1 (04-02-2023)

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Florent Becker, Ehsan Jamshidpour, Philippe Poure, Shahrokh Saadate. Switch Fault detection and localization for T-Type Converter. IEEE Transactions on Industry Applications, 2023, pp.1-8. ⟨10.1109/TIA.2023.3241602⟩. ⟨hal-03971138⟩
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